TY  - BOOK
AU  - Gupta,D.C.
AU  - Bacher,Fred R.
AU  - Hughes,William M.
TI  - Recombination lifetime measurements in silicon
SN  - 0803124899
AV  - TK7871.852 .R43 1998
U1  - 621.3815/2 R311 1998 21
PY  - 1998///
CY  - West Conshohocken, PA
PB  - ASTM
KW  - Semiconductors
KW  - Testing
KW  - Congresses
KW  - Service life (Engineering)
KW  - Forecasting
KW  - Electronic measurements
N1  - Papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif on June 2-3, 1997; "STP 1340."; Includes bibliographical references and indexes
ER  -