VLSI Test Principles and Architectures :
VLSI Test Principles and Architectures : Design for Testability /
edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.
- India : Sanat Printers, 2011[Reprint].
- xxx, 777 p. : ill. ; 25 cm.
- The Morgan Kaufmann series in systems on silicon .
Includes bibliographical references and index.
9789380501550
Integrated circuits--Very large scale integration--Testing.
Integrated circuits--Very large scale integration--Design.
621.395 V865 2011
Includes bibliographical references and index.
9789380501550
Integrated circuits--Very large scale integration--Testing.
Integrated circuits--Very large scale integration--Design.
621.395 V865 2011