Recombination lifetime measurements in silicon /
Recombination lifetime measurements in silicon /
Dinesh C. Gupta, Fred R. Bacher, and William M. Hughes, editors.
- West Conshohocken, PA : ASTM, c1998.
- 392 pages. : ill. ; 24 cm.
Papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif on June 2-3, 1997. "STP 1340."
Includes bibliographical references and indexes.
0803124899
98022034
Semiconductors--Testing--Congresses.
Service life (Engineering)--Forecasting--Congresses.
Electronic measurements--Congresses.
TK7871.852 / .R43 1998
621.3815/2 R311 1998
Papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif on June 2-3, 1997. "STP 1340."
Includes bibliographical references and indexes.
0803124899
98022034
Semiconductors--Testing--Congresses.
Service life (Engineering)--Forecasting--Congresses.
Electronic measurements--Congresses.
TK7871.852 / .R43 1998
621.3815/2 R311 1998