TY  - BOOK
AU  - Wang,Laung-Terng
AU  - Wu,Cheng-Wen
AU  - Wen,Xiaoqing
TI  - VLSI Test Principles and Architectures: Design for Testability 
SN  - 9789380501550
U1  - 621.395 V865 2011 22
PY  - 2011///[Reprint]
CY  - India
PB  - Sanat Printers
KW  - Integrated circuits
KW  - Very large scale integration
KW  - Testing
KW  - Design
N1  - Includes bibliographical references and index; Computer Science and Engineering, Electrical and Electronics Engineering
ER  -