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VLSI Test Principles and Architectures : Design for Testability / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.

Contributor(s): Material type: TextTextSeries: The Morgan Kaufmann series in systems on siliconPublication details: India : Sanat Printers, 2011[Reprint].Description: xxx, 777 p. : ill. ; 25 cmISBN:
  • 9789380501550
Subject(s): DDC classification:
  • 621.395 V865 2011 22
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Item type Current library Call number Copy number Status Barcode
Books Books Premier University Faculty of Engineering Library 621.395 V865 2011 1 Available 16633

Includes bibliographical references and index.

Computer Science and Engineering, Electrical and Electronics Engineering

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