VLSI Test Principles and Architectures : Design for Testability / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.
Material type:
TextSeries: The Morgan Kaufmann series in systems on siliconPublication details: India : Sanat Printers, 2011[Reprint].Description: xxx, 777 p. : ill. ; 25 cmISBN: - 9789380501550
- 621.395 V865 2011 22
| Item type | Current library | Call number | Copy number | Status | Barcode | |
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Premier University Faculty of Engineering Library | 621.395 V865 2011 | 1 | Available | 16633 |
Includes bibliographical references and index.
Computer Science and Engineering, Electrical and Electronics Engineering
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