| 000 | 01350cam a2200325 a 4500 | ||
|---|---|---|---|
| 001 | 1670415 | ||
| 003 | BD-ChPU | ||
| 005 | 20231101120042.0 | ||
| 008 | 980513s1998 paua b 101 0 eng | ||
| 010 | _a 98022034 | ||
| 020 | _a0803124899 | ||
| 040 |
_aDLC _cDLC _dDLC _dBD-ChPU _beng |
||
| 050 | 0 | 0 |
_aTK7871.852 _b.R43 1998 |
| 082 | 0 | 0 |
_a621.3815/2 R311 1998 _221 |
| 245 | 0 | 0 |
_aRecombination lifetime measurements in silicon / _cDinesh C. Gupta, Fred R. Bacher, and William M. Hughes, editors. |
| 260 |
_aWest Conshohocken, PA : _bASTM, _cc1998. |
||
| 300 |
_a392 pages. : _bill. ; _c24 cm. |
||
| 500 | _aPapers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif on June 2-3, 1997. | ||
| 500 | _a"STP 1340." | ||
| 504 | _aIncludes bibliographical references and indexes. | ||
| 650 | 0 |
_aSemiconductors _xTesting _xCongresses. |
|
| 650 | 0 |
_aService life (Engineering) _xForecasting _xCongresses. |
|
| 650 | 0 |
_aElectronic measurements _xCongresses. |
|
| 700 | 1 |
_aGupta, D. C. _q(Dinesh C.) |
|
| 700 | 1 |
_aBacher, Fred R., _d1955- |
|
| 700 | 1 |
_aHughes, William M., _d1948- |
|
| 906 |
_a7 _bcbc _corignew _d1 _eocip _f19 _gy-gencatlg |
||
| 942 |
_2ddc _cBK |
||
| 999 |
_c6750 _d6750 |
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